Name: Tecnai F30TEM
Model: F30 G2 S-TWIN
Manufacturer: FEI, Japan
Installation: Nov. 2003

Specification: 
• Point resolution: 0.204nm
• Line resolution: 0.102nm
• Information resolution: 0.1nm
• HR STEM resolution: 0.17nm
• EELS resolution: 0.3eV
• EDX resolution: 135eV
Application: 
• High resolution transmission electron microscopy
• Observing and analysis to surface figure in STEM mode
• Z-contrast image observing and analysis through
• HAADF detector in STEM mode
• Bright field and dark field image in STEM mode
• Composition analysis at nano scale through X-ray
• energy dispersive spectroscopy in TEM/STEM mode
• Element mapping at atomic scale through Gatan image filter system
• Electron energy loss spectroscopy analysis