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Name: Nanolab Focused ion beam
Model: Nova 200
Manufacturer: FEI, Netherlands
Installation: 2003. Dec

Specification:
Ion optics Sysytem:
  • Resolution of Ion image: 7nm@30kV
  • ion beam current density: 1PA-30nA
  • ion accelerate Voltage : 5-30kV
  • Magnification: 300-500k
Electron Optics System:
  • Resolution: 1.1nm@15kV
  • Beam current density: 1PA-30nA
  • Accelerate voltage: 0.2-30kV
  • Magnification: 35-900k
Application: 
• Micromachining, electron and ion imaging.
• Pt and SiO2 deposition, enhance etching of metal and insulator.
• Measuring element distribution.
• picking up or moving the nano-scale specimens using the nano-manipulator.
• Measuring the electricity of the device ,measuring the force with the micro-force tip(1µN-3mN ).