Name: JEM-2010 TEM
Model: EM-2010ATEM
Manufacturer: JEOL, Japan
Installation: Nov., 2003
Specification: 
• Point resolution: 0.23nm
• Line resolution: 0.14nm
• Magnification: 2000-1200000
• Spherical aberration coefficient: 1.0mm
• Lens chromatic aberration coefficient: 1.4mm
• Camera Length: 8-200cm
• AC: 200KV
Application: 
• High resolution transmission electron microscopy
• Bright field and dark field image
• Element mapping
• EDS,CBD,NBD