Shenyang National Laboratory for Materials Science

Structure Characterization

1.	Tecnai G2 F30 thermal field emission transmission electron microscope
2.	Nova 200 Nanolab Focused Ion Beam System
3.	HF-2000 cold-fieldield emission transmission electron microscope
4.	JEM 2000EXII high-resolution electron microscope
5.	JEM 2000FX analysis transmission electron microscope
6.	JEM 2010 high-resolution transmission electron microscope
7.	JEM 2010 analytical transmission electron microscope
8.	Cambridge S360 scanning electron microscope
9.	LEO Supra 35 scanning electron microscope
10.	D8 Discover X-ray diffractometer
11.	D/max/2400 X-ray diffractometer
12.	HR-800 Labram Ramam spectroscopy

·	Property Evaluation
·	Sample Preparation