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Structure Characterization |
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Tecnai G2 F30 TEM |
JEOL 2010 TEM (HR) |
JEOL 2010 TEM (UHR) |
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Nova 200 Nanolab FIB |
LEO Supra 35 SEM |
Nano-SEM 430 |
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HF-2000 TEM |
D/max/2400 X-ray Diffractometer |
Copyright© Technical Support Division Shenyang National Laboratory for Materials Science.
Address:72 Wenhua Road Shenyang, China 110016
Tel:86-24-83978880 Fax:86-24-23971320 Email:Jtan@imr.ac.cn
Address:72 Wenhua Road Shenyang, China 110016
Tel:86-24-83978880 Fax:86-24-23971320 Email:Jtan@imr.ac.cn