题目：Quantitative and Dynamic X-ray Microtomography for Materials Characterization
报告人: 肖体乔 研究员 （上海光源SSRF/中国科学院上海应用物理研究所 ）
By combining multiple contrasts (absorption, phase, fluorescence, diffraction and SAXS), X-ray microtomography is capable for nondestructive and quantitative investigation on material microstructures and components, element distribution, crystal grain distribution and orientation, nanoparticle distribution and morphology.
Diffraction CT which could resolve the crystal orientation and location in alloys was recently developed. It can identify nondestructively the unknown minor phases in a bulk polycrystalline alloy without priori information. A nano-CT system based on absorption contrast was designed and built to push its spatial resolution from 0.8 µm to 100 nm with a field of view （FOV）of 50 microns. Full field X-ray fluorescence CT for three-dimensional distribution of trace elements inside sample was proposed and demonstrated. SAXS CT for the nanostructure analysis of heterogeneous materials has also been developed.