您当前的位置: 首页> 学术活动

Quantitative and Dynamic X-ray Microtomography for Materials Characterization

信息来源:公共技术服务部        更新时间:2018/4/23


题目:Quantitative and Dynamic X-ray Microtomography for Materials Characterization

报告人: 肖体乔 研究员 (上海光源SSRF/中国科学院上海应用物理研究所 )

时间: 4月23日(周一)10:00-12:00

地点: 李薰楼468会议室

报告简介:

By combining multiple contrasts (absorption, phase, fluorescence, diffraction and SAXS), X-ray microtomography is capable for nondestructive and quantitative investigation on material microstructures and components, element distribution, crystal grain distribution and orientation, nanoparticle distribution and morphology.

Diffraction CT which could resolve the crystal orientation and location in alloys was recently developed. It can identify nondestructively the unknown minor phases in a bulk polycrystalline alloy without priori information. A nano-CT system based on absorption contrast was designed and built to push its spatial resolution from 0.8 µm to 100 nm with a field of view (FOV)of 50 microns. Full field X-ray fluorescence CT for three-dimensional distribution of trace elements inside sample was proposed and demonstrated. SAXS CT for the nanostructure analysis of heterogeneous materials has also been developed.

报告人简介:

肖体乔,研究员,博士生导师,现任上海光源先进成像与工业应用研究部主任。负责上海光源成像线站建设与技术发展,承担国家973项目课题、中科院国际合作重点项目和国家自然科学基金项目等多项科研任务,在国内外著名刊物发表论文100余篇,培养研究生30余名。

Developed by SYNL. Copyright © 沈阳材料科学国家(联合)实验室. 辽ICP备05005387号-9